CHANGJAN, A.; PRAMUANL, P.; MAKSUWAN, A. STATISTICAL SIGNIFICANCE APPROACH FOR DIFFERENT WORK FUNCTION MODELING OF SEMICONDUCTOR. Suranaree Journal of Science and Technology, [S. l.], v. 31, n. 3, p. 030198(1–11), 2024. DOI: 10.55766/sujst-2024-03-e05901. Disponível em: https://ph04.tci-thaijo.org/index.php/SUJST/article/view/5901. Acesso em: 15 sep. 2026.